System and methods for deposition spray of particulate coatings

ABSTRACT

A particle deposition system can have a particle source providing a nanomaterial at a controlled rate and a gas distribution system coupled with the particle source and operable to receive the nanomaterial aerosol. A high pressure chamber can be coupled with the gas distribution system, and a nozzle can be disposed between the high pressure chamber and a low pressure chamber. The nozzle can have a nozzle opening allowing fluidic communication of a nanomaterial aerosol between the high pressure chamber and the low pressure chamber and the opening can have a length exceeding a width.

CROSS REFERENCE TO RELATED APPLICATIONS

This application claims benefit of U.S. Provisional Application No.62/344,283 filed Jun. 1, 2016, the contents of which are entirelyincorporated herein.

FIELD

The present disclosure relates to spray coatings. More specifically, thepresent disclosure relates to deposition spray of particulate coatings.

BACKGROUND

Functional coatings play a role in the development of next generationproducts in the textile, display, automotive, energy and health careindustries. These functional coatings can be formed from a nanomaterialdisposed on a substrate, for example through deposition. Nanomaterialbased coatings can be widely formed in a laboratory setting; however,development of scalable, precise coatings have proven unsuccessful.

BRIEF DESCRIPTION OF THE DRAWINGS

Implementation of the present technology will now be described, by wayof example only, with reference to attached figures, wherein:

FIG. 1 is a diagrammatic view of an example of a particle depositionapparatus in accordance with the present disclosure;

FIG. 2 is a detailed diagrammatic view of an example of a particledeposition apparatus in accordance with the present disclosure;

FIG. 3A is a diagrammatic view of an example particle depositionapparatus having a plurality of nozzles forming a single materialcoating in accordance with the present disclosure;

FIG. 3B is a diagrammatic view of an example particle depositionapparatus having a plurality of nozzles forming three different materialcoatings in accordance with the present disclosure;

FIG. 3C is a diagrammatic view of an example particle depositionapparatus having an upper nozzle and a lower nozzle in accordance withthe present disclosure;

FIG. 4 is a isometric view of a particle deposition system including aparticle source in accordance with the present disclosure;

FIG. 5A is a cross-section view of the particle deposition system ofFIG. 4 taken along line A-A;

FIG. 5B is a bottom cross-section view of the particle deposition systemof FIG. 4 taken along line B-B;

FIG. 6 is a isometric view of a fixed nozzle of a particle depositionsystem in accordance with the present disclosure;

FIG. 7 is a cross-section view of the fixed nozzle of FIG. 6 taken alongline C-C;

FIG. 8A is scanning electron microscope (SEM) micrograph of ananomaterial coating of silica (SiO₂) applied using a particledeposition system according to the present disclosure;

FIG. 8B is an SEM micrograph of a nanomaterial coating of TiO₂ appliedusing a particle deposition system according to the present disclosure;

FIG. 8C is an SEM micrograph of a nanomaterial coating of silicon (Si)applied using a particle deposition system according to the presentdisclosure; and

FIG. 8D is an SEM micrograph of a nanomaterial coating of silver (Ag)nanoparticles applied using a particle deposition system according tothe present disclosure.

The various embodiments described above are provided by way ofillustration only, may not be shown to scale, and should not beconstrued to limit the scope of the disclosure. Therefore, many suchdetails are neither shown nor described. Even though numerouscharacteristics and advantages of the present technology have been setforth in the foregoing description, together with details of thestructure and function of the present disclosure, the disclosure isillustrative only, and changes can be made in the detail, especially inmatters of shape, size and arrangement of the parts within theprinciples of the present disclosure to the full extent indicated by thebroad general meaning of the terms used in the attached claims. It willtherefore be appreciated that the embodiments described above can bemodified within the scope of the appended claims. Claim languagereciting “at least one of” a set indicates that one member of the set ormultiple members of the set satisfy the claim.

DETAILED DESCRIPTION

For simplicity and clarity of illustration, where appropriate, referencenumerals have been repeated among the different figures to indicatecorresponding or analogous elements. In addition, numerous specificdetails are set forth in order to provide a thorough understanding ofthe implementations described herein. However, those of ordinary skillin the art will understand that the implementations described herein canbe practiced without these specific details. In other instances,methods, procedures and components have not been described in detail soas not to obscure the related relevant feature being described. Also,the description is not to be considered as limiting the scope of theimplementations described herein.

Several definitions that apply throughout this disclosure will now bepresented. “Coupled” refers to the linking or connection of two objects.The coupling can be direct or indirect. An indirect coupling includesconnecting two objects through one or more intermediary objects.Coupling can also refer to electrical or mechanical connections.Coupling can also include magnetic linking without physical contact.“Substantially” refers to an element essentially conforming to theparticular dimension, shape or other word that substantially modifies,such that the component need not be exact. For example, substantiallycylindrical means that the object resembles a cylinder, but can have oneor more deviations from a true cylinder. The term “comprising” means“including, but not necessarily limited to”; it specifically indicatesopen-ended inclusion or membership in a so-described combination, group,series and the like.

A “nanomaterial” is any material of which a single unit is sized between1 and 1,000 nanometers. “Deposition” is any process by which particlescollect or deposit themselves on solid or semi-solid surfaces. “Highpressure” can be any pressure above zero and “low pressure” can be anypressure below “high pressure.”

“Hypersonic” is any speed exceeding five (5) times the speed of sound.“Supersonic” is any speed exceeding the speed of sound. “Subsonic” isany speed less than the speed of sound.

The various embodiments described above are provided by way ofillustration only and should not be construed to limit the scope of thedisclosure. Therefore, many such details are neither shown nordescribed. Even though numerous characteristics and advantages of thepresent technology have been set forth in the foregoing description,together with details of the structure and function of the presentdisclosure, the disclosure is illustrative only, and changes can be madein the detail, especially in matters of shape, size and arrangement ofthe parts within the principles of the present disclosure to the fullextent indicated by the broad general meaning of the terms used in theattached claims. It will therefore be appreciated that the embodimentsdescribed above can be modified within the scope of the appended claims.Claim language reciting “at least one of” a set indicates that onemember of the set or multiple members of the set satisfy the claim. Forexample, at least one of A, B, and C, indicates the members can be justA, just B, just C, A and B, A and C, B and C, or A, B, and C.

The present disclosure is drawn to a particle deposition system,apparatus, and related method. A particle deposition system inaccordance with the present disclosure can include a particle sourceproviding a nanomaterial at a controlled rate and a gas distributionsystem coupled with the particle source and operable to receive thenanomaterial. In at least one example, the gas distribution system canbe a gas showerhead. A high pressure chamber can be coupled with the gasdistribution system. A nozzle can be disposed between the high pressurechamber and a low pressure chamber. The nozzle can have a nozzle openingallowing fluidic communication between the high pressure chamber and thelow pressure chamber. The nozzle opening can have a length exceeding awidth, thus forming a substantially slit shaped nozzle.

The low pressure chamber can be operable to receive a substrate and thenozzle can be operable to accelerate a nanomaterial aerosol onto thesubstrate. In at least one example, the nanomaterial aerosol can beaccelerated onto the substrate at hypersonic speeds. In other examples,the nanomaterial aerosol can be accelerated onto the substrate atsupersonic or subsonic speeds.

The nozzle opening can have an adjustable cross-sectional area. Thewidth of the nozzle opening can be formed from two opposing edges, atleast one of the opposing edges movable relative to the other of theopposing edges. Movement of the at least one opposing edge relative tothe other of the opposing edges can thus increase or decrease the widthof the nozzle opening, thereby adjusting the cross-sectional area. In atleast one example, the moveable at least one opposing edge can becoupled with an electric servo motor configured to move the at least oneopposing edge relative to the other of the two opposing edges. Inanother example, each of the two opposing edges can be independentlymovable relative to each other.

The nozzle geometry (specifically the cross-sectional shape), theseparation of the nozzle and the substrate, the pressure drop across thenozzle, and the absolute pressure in the high and low pressure chamberscan individually affect the nanomaterial when it impacts the substrate.Thus, by manipulating these properties individually or in combination,the impact velocity can be controlled. A high impact velocity results infilms where particles are packed closely together. A low impact velocityresults in films where particles are packed less closely together.Packing density of particles can be referred to in terms of theporosity, with densely packed films having a low porosity and lessdensely packed films having a higher porosity.

Adjustment of the nozzle/substrate separation, the impact velocity canbe changed and thus the measured porosity changes. Adjustment of thenozzle geometry, the pressure drop across the nozzle, and the absolutepressure in the chamber can similarly adjust the porosity of the filmcoating. Individual or collective adjustment of these properties canallow for very fine control of the porosity. Highly porous films (lowimpact velocity) can appear “fluffy” when viewed with a scanningelectron micrograph (SEM) while less porous films (higher impactvelocity) can look more like a single solid film. The thickness andporosity of film coatings can by varied independently of each other. Theporosity can be varied between 27% and 95% and the thickness between 5nm and 1 mm.

The low pressure chamber can include a substrate receiving element. Thesubstrate receiving element can have an adjustable height relative tothe nozzle. The nozzle can be moveable relative to the substratereceiving element. The substrate receiving element can include tworollers at opposing ends of the low pressure chamber. One roller can becoupled with a first end of the substrate and the other roller can becoupled with a second end of the substrate with the substratetransitionable from one roller to the other. In other examples, thesubstrate receiving element can be translated using a screw drivepowered by one or more servo motors.

The particle source can be an atomizer, a plasma reactor, a thermalreactor, and/or a flame reactor. The particle source can produce anaerosol from colloidal particles, solvent evaporation, polymer/monomerformation, powder sources, or precursor gases. In at least oneembodiment, the high pressure chamber can be a plasma reactor andprecursor gasses can be fed into the reactor where the plasma catalyzesparticle nucleation and growth of nanoparticles.

In other examples, the high pressure chamber can also be a thermalreactor, where precursor gasses or liquids are fed into the reactor andthe nucleation and growth of particles is induced. In yet otherexamples, the high pressure chamber can also be a plasma reactordesigned not to synthesize particles, but rather to modify them. Thehigh pressure chamber can sustain a plasma designed to etch thenanomaterial fed into it.

The low pressure chamber can be maintained at a pressure ofapproximately 0.001 to 100 Torr and the high pressure chamber can bemaintained at a pressure between 2 and 100 times higher than the lowpressure chamber. Typical operation of the high pressure chamber can bebetween 0.5 Torr and 200 Torr.

The particle deposition apparatus and related system can providemultiple high pressure chambers attached to a single low pressurechamber, thus allowing multiple film coatings with either identical orvarying properties to be deposited on a substrate either sequentially orsimultaneously. The particle deposition system and apparatus furtherallows multiple settings to control film coating porosity and thicknessaccurately across the substrate. Adjustment of the pressure within oneof the high pressure chamber, the low pressure chamber, and/or the flowrate or pressure of the particle source along with adjusting thecross-sectional area of the nozzle opening and the distance between thenozzle and the substrate to be coating can provide a multi-variableadjustment to provide a film coating with particular properties.

FIG. 1 illustrates a diagrammatic view of an example particle depositionapparatus according to the present disclosure. The particle depositionapparatus 100 can have a high pressure chamber 102 and a low pressurechamber 104. A nozzle 106 can be disposed between the high pressurechamber 102 and the low pressure chamber 104. A nozzle opening 108 canprovide fluidic communication between the high pressure chamber 102 andthe low pressure chamber 104. The nozzle opening 108 can have a length110 exceeding a width 112 (shown more clearly in FIG. 2.)

The high pressure chamber 102 can be coupled with a gas distributionsystem 114 receiving a nanomaterial 116 from a particle source. Thenanomaterial can pass through the nozzle opening 108 and acceleratebefore entering the low pressure chamber 104. The gas distributionsystem 114, the high pressure chamber 102, and the slit-shaped nozzle106 can be used together to uniformly distribute nanomaterial 116 from apoint source over the width of the substrate 120. In at least oneexample, the particle deposition system can create non-uniformities ofless than 10%.

The low pressure chamber 104 receives the accelerated nanomaterial 116.The low pressure chamber 104 can have a substrate receiving element 118and a substrate 120. The substrate receiving element 118 can couple withand/or secure the substrate 120 within the low pressure chamber 104. Atleast a portion of the substrate 120 can be disposed beneath the nozzleopening 108 and the nanomaterial 116 can accelerate through the nozzleopening 108 onto the substrate 120. The nanomaterial 116 can accelerateonto the substrate 120 forming a substantially uniform surface coatingon the substrate 120 (shown more clearly in FIGS. 3A-3C).

The substrate receiving element 118 can allow the translation of thesubstrate 120 within the low pressure chamber 104. The substrate 120 canbe translatable in a direction at least perpendicular to the length 110of the nozzle opening 108. The substrate receiving element 118 canprovide translation of the substrate 120 in one direction, twodirections, or any number of directions. In at least one example, thesubstrate receiving element 118 can provide translation of the substratein a direction perpendicular to the length 110 of the nozzle opening,parallel to the length 110 of the nozzle opening, and adjust the heightof the substrate 120 relative to the nozzle opening 108. Translation ofthe substrate 120 within the low pressure chamber 104 can allow thenanomaterial 116 exiting the nozzle opening 108 to impact differentportions of the substrate allowing edge-to-edge coverage. Adjustment ofthe height of the substrate 120 relative to the nozzle 106 can alter theporosity of the film coating 122 formed on the substrate.

The low pressure chamber 104 can have a vacuum pump configured tomaintain the low pressure chamber 104 below atmospheric pressure duringoperation. The high pressure chamber 102 can be maintained at a pressureabove that of the low pressure chamber 104. In at least one example, thehigh pressure chamber 102 can be above atmospheric pressure.

FIG. 2 illustrates a detailed view of an example particle depositionapparatus. The nozzle 106 of the particle deposition apparatus 100 canprovide fluidic communication between the high pressure chamber 102 andthe low pressure chamber 104. The nozzle opening 108 can be asubstantially slit-shaped, having the length 110 exceeding the width112. While the nozzle opening 108 is illustrated having a substantiallyslit-shape, other nozzle opening 108 can be implemented and are withinthe scope of this disclosure. In at least one example, the nozzle 106can be ring shaped to allow coating of cylindrical objects.

The nanomaterial 116 can form a synthesized solution in the highpressure chamber 102 before entering the low pressure chamber 104 viathe nozzle 106. The high pressure chamber 102 can introduce gases orvapors to the nanomaterial 116 to modify and/or synthesize thenanomaterial 116.

The nozzle opening 108 can be a minimal cross-sectional area causing thenanomaterial 116 to accelerate to a high velocity. In at least oneexample, the nanomaterial 116 can accelerate through the nozzle 106 to ahypersonic speed. In other examples, the nanomaterial 116 can acceleratethrough the nozzle 106 to a supersonic or subsonic speed. Theacceleration of the nanomaterial 116 through the nozzle 106 can dependon the geometry of the nozzle 106 and/or the nozzle opening 108, thepressure ratio between the high pressure chamber 102 and the lowpressure chamber 104, the flow rate of the nanomaterial 116, the heightof the nozzle 106, and/or the absolute upstream and/or downstreampressure. The acceleration of the nanomaterial 116 through the nozzleopening can also be limited by the terminal velocity of the nanomaterial116 particle being implemented.

The substantially slit-shaped nozzle opening 108 accelerates thenanomaterial 116 onto the substrate 120 forming a film coating 122 onthe surface of the substrate 120. In at least one example, the nozzleopening 108 can have a length 110 equal to or greater than a width 124of the substrate 120 allowing complete edge-to-edge coverage of the filmcoating 122 on the substrate 120. In other examples, the length 110 ofthe nozzle opening 108 can be less than the width 124 of the substrate120.

FIGS. 3A, 3B, and 3C illustrate example embodiments of particledeposition apparatus. FIG. 3A illustrates a particle depositionapparatus 100 a having a plurality of high pressure chambers 102 and aplurality of nozzles 106. Each of the plurality of high pressurechambers 102 can be coupled with an individual nozzle 106 of theplurality of nozzles 106. Each of the plurality of high pressurechambers 102 can receive a different nanomaterial 116 to form individualfilm coatings 122 a, 122 b, 122 c. The plurality of high pressurechambers 102 can be held at identical pressures or varying pressuresdepending on the various nanomaterials 116 implemented within each highpressure chamber 102. The plurality of nozzles 106 can vary in geometricdesign, cross-sectional area, and/or nozzle depth. The substrate 120 canbe held within a low pressure chamber 104, thus allowing varyingpressure drops for the plurality of nozzles 106 depending on thepressure maintained within the individual high pressure chambers 102.

FIG. 3B illustrates a particle deposition apparatus 100 b having aplurality of high pressure chambers 102 and a plurality of nozzles 106.Each of the plurality of high pressure chambers 102 and the plurality ofnozzles 106 can have identical arrangements in pressure, pressure drop,and nozzle 106 dimensions. The identical arrangements can provide rapid,successive film coatings 122 having identical properties.

In other examples, each high-pressure chamber 102 and nozzle 106 canhave a different nozzle-substrate separation distance. Thenozzle-substrate distance can result in successive film coatings whereeach film coating was formed by impacting nanomaterial 116 at adifferent velocity forming layers with different porosities.

The plurality of high pressure chambers 102 can be coupled withindividual particle sources to ensure proper flow rate of nanomaterial116 from the particle sources. A plurality of particle sources, onecoupled to each high pressure chamber 102, can insure propernanomaterial is provided to the high pressure chamber 102 to form a filmcoating 122 having a desired thickness.

FIG. 3C illustrates a particle deposition apparatus 100 c having anupper high pressure chamber 102 a and upper nozzle 106 a and a lowerhigh pressure chamber 102 b and lower nozzle 106 b. The upper highpressure chamber 102 a and the lower high pressure chamber 102 b can bemaintained at differing settings as described above with respect to FIG.3A or at identical settings as described above with respect to FIG. 3B.The upper nozzle 106 a can be configured to form a film coating 122 d onan upper surface 120 a of the substrate 120 while the lower nozzle 106 bcan be configured to form a film coating 122 e on a lower surface 120 bof the substrate 120. Film coating 122 d and film coating 122 e can bediffering or substantially similar properties depending on thearrangement of the upper high pressure chamber 102 a and the uppernozzle 106 a and the low pressure chamber 104 b and the lower nozzle 106b. While FIG. 3C is illustrated in a substantially vertical arrangementhaving an upper nozzle and a lower nozzle, the particle depositionapparatus can be implemented with a substantially horizontal arrangementhaving one or more high pressure chambers 102 and nozzles coupled with asidewall and depositing nanomaterial on a side surface of the substrate120.

While FIGS. 3A-3C illustrate varying examples having the nozzle 106 at asubstantially 90 degree angle relative to the substrate 120, it iswithin the scope of this disclosure to angle the nozzle 106 relative tothe substrate 120 between approximately 0 and 30 degrees relative to theperpendicular axis of the substrate 120.

FIG. 4 illustrates a particle deposition system 400 according to thepresent disclosure. The particle deposition system 400 can include ahigh pressure chamber 402 and a low pressure chamber 404. A nozzle 406can be disposed between the high pressure chamber 402 and the lowpressure chamber 404 providing fluidic communication therebetween. Thenozzle 406 can have a nozzle opening 408 with a length 410 exceeding awidth 412.

The high pressure chamber 402 can be coupled with a gas distributionsystem 414. The gas distribution system 414 can introduce a nanomaterial416 to the high pressure chamber. The gas distribution system 414 can bea gas showerhead and/or a branching network of tubular gas linesterminating at different portions within the high pressure chamber 402.The gas distribution system 414 can ensure the nanomaterial 416 isevenly distributed within the high pressure chamber 402. In otherembodiments, the gas distribution system 414 can be a fan nozzleconfigured to produce a flat spray of aerosol into the high pressurechamber 402.

The high pressure chamber 402 can have a variable pressure settingand/or variable temperature setting. The pressure and temperaturesettings of the high pressure chamber can be adjusted depending on thenanomaterial 416 implemented and/or the desired porosity of the filmcoating to be formed.

The low pressure chamber 404 can have a substrate receiving element 418disposed therein. The substrate receiving element 418 can couple with asubstrate 420. The substrate receiving element 418 can be configured totranslate the substrate 420 within the low pressure chamber 404.Nanomaterial 416 flowing from the high pressure chamber 402 through thenozzle opening 406 impacts with the substrate 420 to form a film coating422.

Translation of the substrate 420 within the low pressure chamber 404 canexpose varying portions of the substrate 420 to the nozzle opening 408,thereby forming the film coating 422 on varying portions of thesubstrate 420. Translation of the substrate 420 can allow formation offilm coatings 422 on substrate surface areas exceeding the surface areaof the substrate receiving element 418. Translation of the substrate 420through the low pressure chamber 404 can be a variable speed between 1and 150 millimeters per second. Translation speed of the substrate 420can vary depending on the desired film coating 422 thickness to beapplied to the substrate 420.

The substrate receiving element 418 can have two rollers disposed onopposing ends of the low pressure chamber 404. The two rollers can beconfigured to translate the substrate 420 through the nanomaterial 416.One of the two rollers can be configured to store a roll of substrate420 and transfer the substrate 420 during operation to the secondroller, thus forming a film coating 422 on the substrate 420. The tworollers can be configured to allow extended lengths of substrate 420 tobe coated within the low pressure chamber 404. In at least one example,at least one roller can be coupled with a motor to allow translation ofthe substrate 420 through the nanomaterial 416 at a predefined speed.The two rollers can each be coupled with a motor to allow translation ofthe substrate 420 through the nanomaterial 416 in multiple passes at anindividually, predefined speed. In other examples, at least one rollercan be coupled with a handle to allow manual translation of thesubstrate 420 through the nanomaterial 416. In yet other examples, thesubstrate receiving element can be translated using a screw drivepowered by one or more servo motors.

The substrate receiving element 418 can also vary the separation betweenthe substrate 420 and the nozzle 406. In at least one example, thesubstrate receiving element can adjust the separation from approximately0 millimeters to approximately 30 millimeters.

The nozzle opening 406 can have a length 410 equal to or exceeding awidth 424 of the substrate, thus allowing film coating 422 on the entirewidth 424 of the substrate 420. In at least one example, the lowpressure chamber 404 can accommodate a substrate 420 having a width 424of approximately 5 inches.

The low pressure chamber 404 can be maintained at a predeterminedpressure by a vacuum pump 436. In at least one example, the vacuum pump436 can maintain the low pressure chamber 404 between 0.001 Torr and 100Torr.

The gas distribution system 414 can couple with a particle source 426.The particle source 426 can provide the particle deposition system 400with the nanomaterial 416. The particle source 426 can produce anaerosolized nanomaterial 416 at a controlled rate for introduction intothe high pressure chamber 402 via the gas distribution system 414. In atleast one example, the particle source 426 can be an atomizer generatingan aerosolized nanomaterial 416 from a colloidal solution, a solventevaporation (for example, a salt), and/or a polymer/monomer that formsin flight. In other examples, the particle source 426 can be an atomizerproducing an aerosolized nanomaterial 416 from a powder, a plasmareactor producing an aerosol from a precursor gas, a thermal reactorproducing an aerosol from a precursor gas, and/or a flame reactorproducing an aerosol from a precursor gas.

The gas distribution system 414 and the particle source 426 can have aparticle introduction system 428 disposed therebetween. The particleintroduction system 428 can transport the nanomaterial 416 from theparticle source 426 to the gas distribution system 414. The particleintroduction system 428 can modify the nanomaterial 416. In at least oneexample, the particle introduction system 428 can be piping formed froma material configured to prevent chemical or electrostatic interactionwith the nanomaterial 416. In other examples, the particle introductionsystem 428 can be piping equipped with a heater configured to evaporateany solvent droplets, piping equipped with a diffusion dryer toevaporate any solvent, piping equipped with a mass flow controllerconfigured to control the feed rate (for example, a regulator), and/orpiping with one or more recycle streams to collect excess material fromthe generation process.

The high pressure chamber 402 can serve as a transition from the gasdistribution system 414 to the nozzle 406. The high pressure chamber 402can also further control gas distribution to insure uniformity,treat/alter the nanomaterial 416 or nanomaterial aerosol, and/orsynthesize particles. In at least one example, the high pressure chamber402 can function as the aerosol source. The high pressure chamber 402can be configured to sustain a plasma and form particles from one ormore precursor gases. The high pressure chamber 402 can be a thermalreactor forming particles from one or more precursor gases. For examplea hollow chamber, a plasma reactor for treating/synthesizing particles,and/or a thermal reactor for treating/synthesizing particles.

The particle deposition system 400 can further include one or moreprocessors configured to control the high pressure chamber 402, the lowpressure chamber 404, the nozzle opening 406, the gas distributionsystem 414, substrate receiving element 418 and/or the particle source426. The one or more processors can receive an input to maintain aparticular pressure and/or temperature within the high pressure chamber402 or low pressure chamber 404, the cross-sectional area of the nozzleopening 408, the distance between the nozzle 406 and the substrate 420,the translation speed of the substrate 420, and/or the pressure or flowrate of the particle source 426.

In at least one example, the particle deposition system 400 can receiveuser inputs to configure the particle deposition system 400 to apredetermined setting and the one or more processors can adjust theparticle deposition system 400 to the predetermined setting. Thepredetermined settings can be determined by the substrate 420 beingcoating and the desired porosity and thickness of the desired filmcoating. In other examples, the one or more processors can receive aseries of individual settings and the one or more processors can adjustthe series of individual settings (for example, pressure,cross-sectional area, translation speed, etc.).

FIG. 5A illustrates a lateral cross-section view of the particledeposition system 400. FIG. 5B illustrates a bottom cross-section viewof the particle deposition system 400. The nozzle 406 can have anadjustable cross-sectional area by varying the width 412 relative to thelength 410. The nozzle opening 408 can have two opposing side walls 430,432 forming the width 412. At least one opposing sidewall 430, 432 canbe moveable along the width 412 relative to the other opposing sidewall430, 432. Movement of one opposing sidewall 430, 432 closer to the otheropposing sidewall 430, 432 can decrease the nozzle opening 408cross-sectional area, while movement of one opposing sidewall 430, 432away from the other opposing sidewall 430, 432 can increase the nozzleopening 408 cross-sectional area. The cross-sectional area can bedefined by the length 410 times the width 412 of the nozzle opening 408.

In at least one example, at least one opposing sidewall 430, 432 iscoupled with a motor or actuator configured to move the at least oneopposing sidewall 430, 432 relative to the other opposing sidewall 430,432. In other examples, the nozzle opening 408 can have a motor oractuator coupled with each of the two opposing sidewalls 430, 432allowing independent movement of each opposing sidewall 430, 432relative to one another. The nozzle opening 408 can have a pattern ofopenings allowing specific and pre-determined patterns to be formedwithin a film coating on the substrate 420. In at least one example, thenozzle opening 408 can have a pattern of openings blocking at least aportion of the length 410, thus allowing a greater quantity ofnanomaterial 416 to be accelerated onto a particular portion of thesubstrate 420. The nozzle opening 408 can be blocked along at least aportion of the length 410, thus preventing overspray of a narrowersubstrate 420 while also allowing thicker coatings to be formed due toincreased nanomaterial 416 from the particle source 420 sprayed over asmaller area.

In at least one example, the nozzle opening 408 can have a length 410 ofapproximately 5 inches and width 412 variable between approximately0.001 inches and 0.2 inches. Reduction of the width 412 can increase thepressure in the high pressure chamber 402. Increasing the width 412 canreduce the pressure in the high pressure chamber 402.

The particle deposition system 400 can have a base 450 configured tosupport the low pressure chamber 404. The base 450 can be asubstantially tubular structure configured to provide structure supportfor the high pressure chamber 402, low pressure chamber 404, and gasdistribution system 414. In at least one example, the base 450 caninclude tubular members having feed lines for the particle source 426disposed therein. The base 450 can have one or more wheels 452configured to allow movement and positioning of the particle depositionsystem 400.

While the particle deposition system 400 is shown having a single highpressure chamber 402 and nozzle 406, it is within the scope of thisdisclosure to implement any number of high pressure chambers 402 andnozzles 406, for example three, four, or more, within the particledeposition system 400.

FIG. 6 illustrates an example embodiment of a nozzle 606. The nozzle 606can be implemented within particle deposition apparatus 100 or particledeposition system 400. The nozzle 606 can have a fixed cross-sectionalarea defined by a fixed length 610 and fixed width 612. A particledeposition system 400 implementing the nozzle 606 having a fixedcross-sectional area can produce varying film coatings 422 by varyingother parameters within the particle deposition system 400, for example,high pressure chamber 402 settings, low pressure chamber 404 settings,distance between nozzle 606 and substrate 420, and/or particle source426 settings.

FIG. 7 illustrates a cross-sectional view of nozzle 606. The nozzle 606can have inwardly sloped sidewalls 634 formed along the length 610 ofthe nozzle 606. The sloped sidewalls 634 can form the reducedcross-sectional area thus accelerating nanomaterial through the nozzle606. In at least one example, the nozzle 606 can acceleratenanomaterials 616 to hypersonic speeds. In other examples, the nozzle606 can accelerate the nanomaterial 616 to subsonic or supersonicspeeds.

FIGS. 8A-8D illustrate example film coatings 822 deposited on asubstrate 820 according to the present disclosure.

FIG. 8A illustrates a SEM cross-section of a film coating. Themagnification at 500× and 100,000× details a film coating of 20nanometer (nm) diameter silica (SiO₂) nanoparticles. These nanoparticlesstarted out as a colloidal solution that was atomized and fed into thedeposition system where they were deposited on a polished siliconsubstrate.

FIG. 8B illustrates a SEM cross-section at 35,000× magnification of afilm composed of 25 nm diameter titania (TiO₂) nanoparticles. Thesenanoparticles started out as a colloidal solution that was atomized andfed into the deposition system where they were deposited on a polishedsilicon substrate. A metallic coating was deposited on top using asputtering system to improve the image quality.

FIG. 8C illustrates an SEM cross-section of a film composed of 7 nmdiameter silicon (Si) nanoparticle. The nanoparticles were deposited ona textured solar cell between the cell and the electrical contact(silver layer). These nanoparticles were synthesized from precursorgasses (Silane [SiH₄] and helium) in a plasma reactor coupled to thedeposition system. The particles were dragged out of the plasma reactorinto the deposition system where they were deposited on the substrate.

FIG. 8D illustrates SEM cross-sections of a 50 nm diameter silvernanoparticles deposited on a water filtration membrane. Thesenanoparticles started out as a colloidal solution that was atomized andfed into the deposition system where they were deposited on a polishedsilicon substrate.

It is believed the exemplary embodiment and its advantages will beunderstood from the foregoing description, and it will be apparent thatvarious changes may be made thereto without departing from the spiritand scope of the disclosure or sacrificing all of its advantages, theexamples hereinbefore described merely being preferred or exemplaryembodiments of the disclosure.

What is claimed is:
 1. A particle deposition system comprising: aparticle source operable to provide a plurality of nanomaterials at acontrolled rate; a gas distribution system coupled with the particlesource and operable to receive the nanomaterials; a high pressurechamber coupled with the gas distribution system; a nozzle, having anentrance and an exit, coupled to the high pressure chamber at theentrance; and a low pressure chamber coupled to the nozzle at the exit,wherein a nozzle opening allows fluidic communication of a nanomaterialaerosol between the high pressure chamber and the low pressure chamber,the nozzle opening having a length exceeding a width; wherein the widthof the nozzle opening is formed from two opposing edges, at least one ofthe opposing edges movable relative to the other of the opposing edgesand changing the width of the nozzle opening.
 2. The particle depositionsystem of claim 1, wherein the low pressure chamber is operable toreceive a substrate and the nozzle is operable to accelerate thenanomaterial aerosol onto the substrate at hypersonic speeds.
 3. Theparticle deposition system of claim 1, wherein the nozzle opening has anadjustable cross-sectional area.
 4. The particle deposition system ofclaim 1, wherein one of the two opposing edges is coupled with a servomotor, the servo motor is operable to move the opposing edge relative tothe other of the two opposing edges.
 5. The particle deposition systemof claim 1, wherein the low pressure chamber includes a substratereceiving element.
 6. The particle deposition system of claim 5, whereinthe substrate receiving element has an adjustable separation relative tothe nozzle.
 7. The particle deposition system of claim 5, wherein thesubstrate receiving element includes two rollers disposed at opposingends of the low pressure chamber, one roller couplable with a first endof the substrate and the other roller couplable with a second end of thesubstrate, the substrate transitionable from one roller to the otherroller.
 8. The particle deposition system of claim 1, wherein the nozzleis movable relative to the substrate receiving element.
 9. The particledeposition system of claim 1, wherein the particle source is anatomizer.
 10. The particle deposition system of claim 1, wherein theparticle source is one of a plasma reactor or flame reactor.
 11. Theparticle deposition system of claim 1, wherein a pressure of the lowpressure chamber is maintained between 0.001 Torr and 100 Torr.
 12. Theparticle deposition system of claim 1, wherein the gas distributionsystem comprises a gas showerhead.